Multiplexers mainly employed to minimize the delay and power consumption. High fault coverage is achieved through set and reset technique. Pre-charge method is reducing the delay and power consumption there by maximizing the operating frequency angle with high performance. The proposed approach uses Bit Swapping-Linear Feedback Shift Register (BS-LFSR) architecture which integrates pre-charge, set-reset and gate replacement with mux techniques have alleviated the inherent drawbacks of linear feedback shift register and produced better results. Reduction of delay, power consumptions and fault coverage are considered as major factors from the above methods. There are several contributions made by researchers which are majorly based on Linear Feedback Shift Register (LFSR), bit swapping LFSR and dual threshold bit swapping LFSR methods. The data collected during testing is used to remove the faulty parts from the products and help to enhance the design and manufacturing process and improve the returns as well. All the circuits or products must be verified before delivery. Testing becomes an inevitable part of the VLSI circuit.
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